EVM629AXF中文資料升特數(shù)據(jù)手冊PDF規(guī)格書

Description

The Edge629 is a monolithic timing delay and signal fanout solution manufactured in a high-performance bipolar process. In Automatic Test Equipment (ATE) applications, the Edge629 buffers, distributes, and aligns timing signals across multiple channels (typically found inside Memory Test Systems). It is also suitable for per pin deskew in Logic Testers.

Features

? Fmax ≥ 1 GHz

? Independent Falling Edge Adjust

? Small Footprint (10 mm x 10 mm)

? Excellent Timing Accuracy

? Very Stable Timing Delays

? 5 ps Resolution

? ECL, CMOS Compatible Inputs

Applications

? Memory Test Equipment

– Data Fanout

– Channel Deskew

? Logic Testers

– Per Pin Deskew

? Clock / Signal Fanout