| 零件編號(hào) | 下載 訂購 | 功能描述/絲印 | 制造商 上傳企業(yè) | LOGO |
|---|---|---|---|---|
5962R1722001VXC | Marking：5962R1722001VXC；Package：CFP；TPS7H2201-SP Radiation Hardened 1.5-V to 7-V, 6-A Load Switch 1Features 1?Radiationperformance: –Radiationhardnessassurance(RHA)upto TID100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR)immunetoLET=75MeV-cm2/mg –SEFI/SETcharacterizedto LET=75MeV-cm2/mg ?Integratedsingle | TITexas Instruments 德州儀器美國德州儀器公司 | TI | |
5962R1722001VXC | Marking：5962R1722001VXC；Package：CFP；TPS7H2201-SP and TPS7H2201-SEP Radiation Hardened 1.5-V to 7-V, 6-A eFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR) | TI1Texas Instruments 德州儀器美國德州儀器公司 | TI1 | |
5962R1722001VXC | Marking：5962R1722001VXC；Package：CFP；TPS7H2201-SP and TPS7H2201-SEP Radiation Hardened 1.5V to 7V, 6A eFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR)i | TI1Texas Instruments 德州儀器美國德州儀器公司 | TI1 | |
5962R1722001VXC | Marking：5962R1722001VXC；Package：CFP；TPS7H2201-SP and TPS7H2201-SEP Radiation Hardened 1.5V to 7V, 6A eFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR)i | TI2Texas Instruments 德州儀器美國德州儀器公司 | TI2 | |
5962R1722001VXC | Marking：5962R1722001VXC；Package：CFP；Radiation Hardened 1.5-V to 7-V, 6-A Load Switch | TI1Texas Instruments 德州儀器美國德州儀器公司 | TI1 |
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