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CD74ACT86MDREP

Marking：ACT86MEP；Package：SOIC；QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE

FEATURES ·ControlledBaseline –OneAssembly/TestSite,OneFabrication Site ·ExtendedTemperaturePerformanceof –55°Cto125°C ·EnhancedDiminishingManufacturing Sources(DMS)Support ·EnhancedProduct-ChangeNotification ·QualificationPedigree(1) ·InputsAreTTL-VoltageCompa

TI2Texas Instruments

德州儀器美國德州儀器公司

CD74ACT86MDREP.A

Marking：ACT86MEP；Package：SOIC；QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE

FEATURES ·ControlledBaseline –OneAssembly/TestSite,OneFabrication Site ·ExtendedTemperaturePerformanceof –55°Cto125°C ·EnhancedDiminishingManufacturing Sources(DMS)Support ·EnhancedProduct-ChangeNotification ·QualificationPedigree(1) ·InputsAreTTL-VoltageCompa

TI2Texas Instruments

德州儀器美國德州儀器公司

V62/06620-01XE

Marking：ACT86MEP；Package：SOIC；QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE

FEATURES ·ControlledBaseline –OneAssembly/TestSite,OneFabrication Site ·ExtendedTemperaturePerformanceof –55°Cto125°C ·EnhancedDiminishingManufacturing Sources(DMS)Support ·EnhancedProduct-ChangeNotification ·QualificationPedigree(1) ·InputsAreTTL-VoltageCompa

TI2Texas Instruments

德州儀器美國德州儀器公司

V62SLASH06620-01XE

Marking：ACT86MEP；Package：SOIC；QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE

FEATURES ·ControlledBaseline –OneAssembly/TestSite,OneFabrication Site ·ExtendedTemperaturePerformanceof –55°Cto125°C ·EnhancedDiminishingManufacturing Sources(DMS)Support ·EnhancedProduct-ChangeNotification ·QualificationPedigree(1) ·InputsAreTTL-VoltageCompa

TI2Texas Instruments

德州儀器美國德州儀器公司

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